演講題目： 
Small-Scale Mechanical Testing – Why and How? 

演講人：

國立中山大學/機械與機電工程學系
李伯軒 助理教授

115.05.25上午10點20分                                             
演講地點：博雅館102室

演講摘要：

Small-scale mechanical tests are extremely powerful techniques in materials development. Not only it significantly reduces the material volume required for testing, but also provides a direct method for extracting mechanical behavior from individual microstructural features. Furthermore, focused-ion beam machining can be used to fabricate micro-scale specimen which allow more mechanical properties to be measured. In this seminar, I will first provide a quick introduction of various small-scale mechanical testing geometries, then provide examples from metallurgy and semiconductor research. Some future aspects will also be discussed.